IRCT20180407039212N1 IRCT 2018-05-16 Ahvaz University of Medical Sciences Effect of low level diode laser on dental implant stability Effect of 810 nanometer (nm) low level diode laser irradiation on dental implant stability in posterior mandibular region . 2017-06-27 anticipated 28 Complete https://irct.ir/trial/30868 interventional Randomization: Randomized, Blinding: Double blinded, Placebo: Not used, Assignment: Parallel, Purpose: Supportive, Randomization description: After the surgery, one of the sides of the lower jaw of the patients was randomly (computer-generated random numbers ) chosen to receive low level laser treatment (test group). The other side of the jaw was placebo, without any treatment performed and served as a control (control group), Blinding description: All assessments of the study outcomes were performed in a double blind manner, since neither patients (due to placebo) or assessors (not involved in low level laser therapy) were aware of treatment allocation. N/A Dental implant stability. Intervention 1: Intervention group:In the group, diode laser 810( nm) (QuickLase, England) was erradiation by tissue probe from the buccal and lingual sides in contact without mucosa (40mw in 4 second) and repeated at 3, 7, 10, 14. Intervention 2: Control group: laser irradeation was off. No - There is not a plan to make this available Justification or reason for not sharing IPD is Corresponding to thesis